fib cross sections for sem and stem analysis Search Results


fib cross sections for sem and stem analysis  (NanoLab Inc)
90
NanoLab Inc fib cross sections for sem and stem analysis
Focused ion <t>beam</t> <t>(FIB)</t> cross-sectional scanning electron micrograph <t>(SEM)</t> and scanning transmission electron micrographs (STEM) of CdTe deposited on (a, d) CdS, (b, e) CdS/CdSe, and (c, f) CdSe.
Fib Cross Sections For Sem And Stem Analysis, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Focused ion beam (FIB) cross-sectional scanning electron micrograph (SEM) and scanning transmission electron micrographs (STEM) of CdTe deposited on (a, d) CdS, (b, e) CdS/CdSe, and (c, f) CdSe.

Journal: ACS Applied Materials & Interfaces

Article Title: Microscopic Analysis of Interdiffusion and Void Formation in CdTe (1– x ) Se x and CdTe Layers

doi: 10.1021/acsami.0c09381

Figure Lengend Snippet: Focused ion beam (FIB) cross-sectional scanning electron micrograph (SEM) and scanning transmission electron micrographs (STEM) of CdTe deposited on (a, d) CdS, (b, e) CdS/CdSe, and (c, f) CdSe.

Article Snippet: Focused ion beam (FIB) cross sections for SEM and STEM analysis were prepared using an FEI Helios MK2 Nanolab Dual Beam system.

Techniques: Transmission Assay